25. Appendix H Trim and Calibration¶
The following table presents a list of the registers which are included in the TCS. Not all of them are required but no other than those in the Table 75 can be included.
| TRIM & CALIBRATION SECTION | Chip Revision | |||
|---|---|---|---|---|
| # | Register | What | Who | DA14680/1-01 |
| 1 | CLK_32K_REG | Program RC32K_TRIM | Dialog at Production Testing | Used |
| 2 | CLK_RCX20K_REG | Program RCX20K_TRIM | Dialog at Production Testing | Used |
| 3 | CLK_16M_REG | RC16M_TRIM | Dialog at Production Testing | Used |
| 4 | CLK_FREQ_TRIM_REG | Crystal Dependent | Customer at Product Line Testing | Used |
| 5 | XTALRDY_CTRL_REG | Crystal Dependent | Customer at Product Line Testing | Used |
| 6 | BANDGAP_REG | Dialog at Production Testing | Used | |
| 7 | CHARGER_CTRL2_REG | Dialog at Production Testing | Used | |
| 8 | RF_BIAS_CTRL1_BLE_REG | Dialog at Production Testing | Used | |
| 9 | RF_LNA_CTRL1_REG | Dialog at Production Testing | Used | |
| 10 | RF_LNA_CTRL2_REG | Dialog at Production Testing | Used | |
| 11 | RF_VCOCAL_CTRL_REG | Dialog at Production Testing | Used | |
| 12 | RF_MIXER_CTRL1_BLE_REG | Dialog at Production Testing | Used | |
| 13 | RF_VCO_CTRL_REG | Dialog at Production Testing | Used | |
| 14 | RF_SPARE1_BLE_REG | Dialog at Production Testing | Used | |
| 15 | RF_DIV_IQ_RX_REG | Dialog at Production Testing | Not Used | |
| 16 | RF_DIV_IQ_TX_REG | Dialog at Production Testing | Not Used | |
| 17 | BOD_CTRL2_REG | Which rail to BOD protect | Customer at Product Line Testing | Used |
| 18 | RF_BIAS_CTRL1_FTDF_REG | Dialog at Production Testing | Used | |
| 19 | RF_MIXER_CTRL1_FTDF_REG | Dialog at Production Testing | Used | |
| 20 | LED_CONTROL_REG | Dialog at Production Testing | Not Used | |
| 21 | Free | |||
| 22 | Free | |||
| 23 | Free | |||
| 24 | Free | |||
Note
TCS value of XTALRDY_CTRL_REG is in clock cycles for 32000/32768. In the case of RCX, it will not be applied. Instead, the hard-coded value of the SmartSnippets™ DA1468x SDK will be applied.